Semiconductor metrology and inspection
8 European H2020 organizations list this as part of their work — 7 as their primary capability.
Most active in this area
- NOVA LTD
Israeli semiconductor metrology company providing advanced measurement and process control systems for Europe's sub-10nm chip manufacturing R&D programs.
“Core contributor to MADEin4 (metrology for digitized ECS), 3DAM (3D Advanced Metrology), and measurement workstreams across IT2, ID2PPAC, PIN3S, TAPES3, TAKEMI5, and TAKE5.”
PrimaryIL12 projects - APPLIED MATERIALS ISRAEL LTD
Global semiconductor equipment leader providing advanced metrology, inspection, and AI-driven process control for chip manufacturing from 7nm to 2nm nodes.
“Core contributor across MADEin4 (which they coordinated), 3DAM, IT2, ID2PPAC, PIN3S, and TAPES3 — all focused on measurement and characterization for advanced nodes.”
PrimaryIL11 projects - SEMILAB FELVEZETO FIZIKAI LABORATORIUM ZARTKORUEN MUKODO RESZVENYTARSASAG
Hungarian SME providing semiconductor metrology and material characterization equipment for nanoscale manufacturing across electronics, energy, and advanced materials.
“Core contributor across SeNaTe (7nm), 3DAM (advanced metrology), TAKEMI5 (5nm), MADEin4 (digitized metrology), IT2 (2nm node), and RealNano (nano-characterization).”
PrimarySMEHU11 projects - CARL ZEISS SMT GMBH
World-class EUV lithography and metrology equipment provider driving Europe's semiconductor manufacturing from 7nm to 2nm nodes.
“Metrology appears as a key focus in IT2, ID2PPAC, and is implicit in equipment contributions to TAPES3 and PIN3S.”
PrimaryDE8 projects - KLA-TENCOR CORPORATION (ISRAEL)
Global semiconductor metrology and inspection leader contributing process control expertise to Europe's 7nm-to-2nm chip manufacturing roadmap.
“Core contributor across all eight projects from SeNaTe (7nm) through ID2PPAC (2nm), with metrology explicitly named in MADEin4, IT2, and ID2PPAC.”
PrimaryIL8 projects - GLOBALFOUNDRIES Dresden Module One LLC & Co. KG
Major European semiconductor fab specializing in FDSOI process technology for automotive, 5G, IoT, and silicon photonics applications.
“MADEin4 focused on AI-driven metrology and inspection platforms for Industry 4.0 semiconductor manufacturing.”
DE7 projects - ICOS VISION SYSTEMS NV
Semiconductor inspection and metrology specialist providing vision-based quality control for chip manufacturing, advanced packaging, and photonics integration.
“Central to MADEin4 (metrology for digitized ECS), ID2PPAC (2nm node metrology), and TAKEMI5 (5nm module integration).”
PrimaryBE5 projects - ICT Integrated Circuit Testing GmbH
German semiconductor metrology and inspection specialist contributing testing expertise to Europe's most advanced chip manufacturing programs.
“Central to all three projects: SeNaTe (7nm), TAKEMI5 (5nm), and MADEin4 (metrology for digitized ECS industry)”
PrimaryDE3 projects